Consumables available to Ceitec Nano users. This is not an e-shop.
Advanced Computing in Electron Microscopy 0 Kč 1 pc.
An Introduction to Graphene and Carbon Nanotubes 0 Kč 1 pc.
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (IOP Concise Physics) 0 Kč 1 pc.
Atom-Probe Tomography 0 Kč 1 pc.
Confocal Raman microscopy 0 Kč 1 pc.
CVD Polymers: Fabrication of Organic Surfaces and Devices 0 Kč 1 pc.
Dry Etching Technology for Semiconductors 0 Kč 1 pc.
Electron Crystallography 0 Kč 1 pc.
Electron Diffraction in the Electron Microscope (Monographs in Practical Electron Microscopy in Materials Sci) 0 Kč 1 pc.
Electron Energy-Loss Spectroscopy in the Electron Microscope 0 Kč 1 pc.
Electron-Beam Technology in Microelectronic Fabrication 0 Kč 1 pc.
Field Emission Scanning Electron Microscopy 0 Kč 1 pc.
Fundamental Principles of Optical Lithography: The Science of Microfabrication. 0 Kč 1 pc.
Fundamentals of semiconductors : physics and materials properties 0 Kč 1 pc.
Handbook of Deposition Technologies for Films and Coatings, Third Edition: Science, Applications and Technology 0 Kč 1 pc.
Handbook of ellipsometry 0 Kč 1 pc.
Handbook of Microscopy 0 Kč 1 pc.
Handbook of Microscopy 0 Kč 1 pc.
Handbook of Microscopy 0 Kč 1 pc.
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis. 0 Kč 1 pc.
Helium Ion Microscopy 0 Kč 1 pc.
Chemistry and Lithography 0 Kč 1 pc.
In-Situ Electron Microscopy: Applications in Physics 0 Kč 1 pc.
Interpretation of Transmission Electron Micrographs 0 Kč 1 pc.
Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice. 0 Kč 1 pc.
Ion Beams - New Applications from Mesoscale to Nanoscale: Volume 1354 (MRS Proceedings). 0 Kč 1 pc.
Lithography 0 Kč 1 pc.
Low Voltage Electron Microscopy 0 Kč 1 pc.
Materials and Processes for Next Generation Lithography, Volume 11 0 Kč 1 pc.
Micro and Nano Fabrication: Tools and Processes. 0 Kč 1 pc.
Nanofabrication using focused ion and electron beams : principles and applications 0 Kč 1 pc.
Nanofabrication: Principles, Capabilities and Limits. 0 Kč 1 pc.
Nanofabrication: Techniques and Principles. 0 Kč 1 pc.
Nanoindentation 0 Kč 1 pc.
Nanotribology and Nanomechanics 0 Kč 1 pc.
Optical Properties of Solids (Oxford Master Series in Physics). 0 Kč 1 pc.
Physics of Organic Semiconductors, 2nd, Completely New Revised Edition 0 Kč 1 pc.
Raman Spectroscopy and its Application in Nanostructures. 0 Kč 1 pc.
Resolution Enhancement Techniques in Optical Lithography (SPIE Tutorial Texts in Optical Enginee 0 Kč 1 pc.
Sample Preparation Handbook for Transmission Electron Microscopy 0 Kč 1 pc.
Sample Preparation Handbook for Transmission Electron Microscopy 0 Kč 1 pc.
Scanning Electron Microscopy and X-Ray Microanalysis 0 Kč 1 pc.
Scanning Probe Microscopy, The Lab on a Tip 0 Kč 1 pc.
Scanning Transmission Electron Microscopy: Imaging and Analysis 0 Kč 1 pc.
Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization 0 Kč 1 pc.
Semiconductor material and device characterization 0 Kč 1 pc.
Semiconductor Nanostructures: Quantum states and electronic transport. 0 Kč 1 pc.
Spectroscopic ellipsometry : principles and applications 0 Kč 1 pc.
Strojnické tabulky 0 Kč 1 pc.
Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy 0 Kč 1 pc.
Surface Microscopy with Low Energy Electrons 0 Kč 1 pc.
The Art of Electronics 0 Kč 1 pc.
Tip-Enhanced Raman Spectroscopy for Nanoelectronics. 0 Kč 1 pc.
ToF-SIMS: Surface Analysis by Mass Spectrometry 2nd Edition 0 Kč 1 pc.
Transmission Electron Microscopy in Micro-nanoelectronics 0 Kč 1 pc.
Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State (Springer Tracts in Modern Physics) 0 Kč 1 pc.
Transmission Electron Microscopy: A Textbook for Materials Science. 0 Kč 1 pc.
Typical Electron Microscope Investigations (Monographs in Practical Electron Microscopy in Materials Sci) 0 Kč 1 pc.
X-Ray Diffraction Crystallography 0 Kč 1 pc.